Advances in computational electrodynamics : the - download pdf or read online

By Allen Taflove

ISBN-10: 0890068348

ISBN-13: 9780890068342

Edited by means of the pioneer and ultimate authority at the topic, this is the 1st booklet to gather in a single source the most recent innovations and result of the best theoreticians and practitioners of FD-TD computational electromagnetics modelling. Designed to construct on his renowned 1995 e-book, "Computational Electrodynamics: The Finite-Difference Time-Domain Method", the writer describes and indicates tips on how to observe the most recent advances in FD-TD in designing better-performing microwave and millimeter wave units and circuits, high-speed electronic circuits, VLSI-scale optical units and ultra-wideband and shrewdpermanent antennas. This unmarried professional resource may also aid remedy a large choice of difficulties within the following parts: imaging of underground and organic buildings; comparing the security of instant units, together with cell phones; bioelectromagnetics security evaluation and scientific functions; and completely matched layer media, periodic media, high-order equipment, multiresolution concepts and unstructured grids

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Additional info for Advances in computational electrodynamics : the finite-difference time-domain method

Example text

Therefore, it is a common practice to assume the occurrence of only singlestuck-line (SSL) faults in the Ie. Hence, for an IC with n lines, only 2n SSL faults are possible. 1: The SAF classes in a 2 input NAND gate. 2 Fault Equivalence, Dominance and Collapsing A fault f1 is considered to be equivalent to fault f2, if their faulty behaviors for all possible input stimuli are indistinguishable from each other at primary outputs. Therefore, a stimulus detecting f1 will also detect f2. Such faults can be bunched into an equivalent fault class.

However, practicality of these schemes is limited owing to high area overhead and performance degradation Reddy et al. [67] presented a procedure to find the robust 2-pattern test for SOP faults in combinational circuits, if such a procedure existed, which will not be invalidated in the presence of arbitrary circuit delays. They assumed that T2 of the 2-pattern test is given and then provided a procedure to determine an appropriate initializing input Tl. If no appropriate Tl is found, another test T2 is determined and then the procedure is repeated.

Irrespective of the fault mode (gate or path delay) 2-pattem test may be categorized as robust or non-robust. A robust test detects the targeted delay faults irrespective of the presence of other delay faults in the circuit. , hazard free robust test, single/multiple input changing tests, and single/multiple path propagating tests. A necessary and sufficient set of path delay faults known as primitive delay faults must be tested to guarantee timing correctness of the circuit [39]. An important property of a path delay test is that the test must not be invalidated by variable delays of the fan-in signals of gates on the targeted path.

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Advances in computational electrodynamics : the finite-difference time-domain method by Allen Taflove

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